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Role of boron and (√3 _x √3)-B surface defects on the growth mode of Si on Si(111): A photoemission and electron diffraction studyFISSEL, Andreas; KRÜGENER, Jan; SCHWENDT, Dominik et al.Physica status solidi. A, Applications and materials science (Print). 2010, Vol 207, Num 2, pp 245-253, issn 1862-6300, 9 p.Conference Paper

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Effect of phosphorus concentration on the electronic structure of nanocrystalline electrodeposited Ni-P alloys : an XPS and XAES investigationELSENER, B; ATZEI, D; KROLIKOWSKI, A et al.Surface and interface analysis. 2008, Vol 40, Num 5, pp 919-926, issn 0142-2421, 8 p.Article

Femtosecond spin dynamics of ferromagnetic thin films and nanodots probed by spin polarized photoemission electron microscopy : Ultrafast magnetization ProcessesHEITKAMP, B; KRONAST, F; HEYNE, L et al.Journal of physics. D, Applied physics (Print). 2008, Vol 41, Num 16, issn 0022-3727, 164002.1-164002.5Article

Functionalization of hydrogen-free diamond-like carbon films using open-air dielectric barrier discharge atmospheric plasma treatmentsENDRINO, J. L; MARCO, J. F; ALLEN, M et al.Applied surface science. 2008, Vol 254, Num 17, pp 5323-5328, issn 0169-4332, 6 p.Article

Photoelectron spectroscopic studies of ultra-thin CuPc and PTCDA layers on Cu(100)ANDREASSON, M; TENGELIN-NILSSON, M; ILVER, L et al.Synthetic metals. 2008, Vol 158, Num 1-2, pp 45-49, issn 0379-6779, 5 p.Article

Electron spectroscopy of functional organic thin films : Deep insights into valence electronic structure in relation to charge transport propertyUENO, Nobuo; KERA, Satoshi.Progress in surface science. 2008, Vol 83, Num 10-12, pp 490-557, issn 0079-6816, 68 p.Article

X-ray photoelectron and X-ray Auger electron spectroscopy studies of heavy ion irradiated C₆₀ filmsKUMAR, Amit; SINGH, F; GOVIND et al.Applied surface science. 2008, Vol 254, Num 22, pp 7280-7284, issn 0169-4332, 5 p.Article

Electronic and geometric structure of methyl oxirane adsorbed on Si(1 0 0)2 × 1PIANCASTELLI, M. N; BAO, Z; HENNIES, F et al.Applied surface science. 2007, Vol 254, Num 1, pp 108-112, issn 0169-4332, 5 p.Conference Paper

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Preparation and characterization of nitrogen-incorporated SnO₂ filmsPAN, S. S; YE, C; TENG, X. M et al.Applied physics. A, Materials science & processing (Print). 2006, Vol 85, Num 1, pp 21-24, issn 0947-8396, 4 p.Article

XPS study of pulsed Nd:YAG laser oxidized SiAYGUN, G; ATANASSOVA, E; KOSTOV, K et al.Journal of non-crystalline solids. 2006, Vol 352, Num 28-29, pp 3134-3139, issn 0022-3093, 6 p.Article

High-resolution photoemission on Ag/Au(111) : Spin-orbit splitting and electronic localization of the surface statePOPOVIC, D; REINERT, F; HÜFNER, S et al.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 4, pp 045419.1-045419.4, issn 1098-0121Article

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